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162
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MTDT
2003
IEEE
164views Hardware» more  MTDT 2003»
15 years 10 months ago
Applying Defect-Based Test to Embedded Memories in a COT Model
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
Robert C. Aitken
POS
1987
Springer
15 years 8 months ago
Realisation of a Dynamically Grouped Object-Oriented Virtual Memory Hierarchy
Conventional paging systems do not perform well with large object-oriented environments (such as Smalltalk-801 [GR83]) due to the fine granularity of objects and the persistence o...
Ifor Williams, Mario Wolczko, T. P. Hopkins
USENIX
2007
15 years 7 months ago
A Memory Soft Error Measurement on Production Systems
Memory state can be corrupted by the impact of particles causing single-event upsets (SEUs). Understanding and dealing with these soft (or transient) errors is important for syste...
Xin Li, Kai Shen, Michael C. Huang, Lingkun Chu
ASPLOS
2006
ACM
15 years 7 months ago
Tradeoffs in fine-grained heap memory protection
Different uses of memory protection schemes have different needs in terms of granularity. For example, heap security can benefit from chunk separation (by using protected "pa...
Jianli Shen, Guru Venkataramani, Milos Prvulovic
126
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CORR
2010
Springer
83views Education» more  CORR 2010»
15 years 5 months ago
Swapping Evaluation: A Memory-Scalable Solution for Answer-On-Demand Tabling
One of the differences among the various approaches to suspension-based tabled evaluation is the scheduling strategy. The two most popular strategies are local and batched evaluat...
Pablo Chico de Guzmán, Manuel Carro, David ...