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DELTA
2004
IEEE
15 years 10 months ago
Scan Test of IP Cores in an ATE Environment
Manufacturing test of chips made of multiple IP cores requires different techniques if ATE is used. As scan chains are commonly used as access paths to the DUT, ATE architectures ...
Luca Schiano, Yong-Bin Kim, Fabrizio Lombardi
FTCS
1996
132views more  FTCS 1996»
15 years 7 months ago
An Approach towards Benchmarking of Fault-Tolerant Commercial Systems
This paper presents a benchmark for dependablesystems. The benchmark consists of two metrics, number of catastrophic incidents and performance degradation, which are obtained by a...
Timothy K. Tsai, Ravishankar K. Iyer, Doug Jewitt
GIS
2006
ACM
15 years 6 months ago
Dynamic simplification and visualization of large maps
In this paper, we present an algorithm that performs simplification of large geographical maps through a novel use of graphics hardware. Given a map as a collection of non-interse...
Nabil H. Mustafa, Shankar Krishnan, Gokul Varadhan...
CAD
2000
Springer
15 years 6 months ago
Time-critical multiresolution rendering of large complex models
Very large and geometrically complex scenes, exceeding millions of polygons and hundreds of objects, arise naturally in many areas of interactive computer graphics. Time-critical ...
Enrico Gobbetti, Eric Bouvier
129
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ICST
2010
IEEE
15 years 4 months ago
Does Hardware Configuration and Processor Load Impact Software Fault Observability?
Intermittent failures and nondeterministic behavior complicate and compromise the effectiveness of software testing and debugging. To increase the observability of software faults,...
Raza Abbas Syed, Brian Robinson, Laurie A. William...