10 search results - page 1 / 2 » Confidence Scalable Post-Silicon Statistical Delay Predictio... |
75
Voted
DAC
2007
ACM
15 years 12 months ago
2007
ACM
Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that g...
DAC
2010
ACM
15 years 2 months ago
2010
ACM
The identification of speedpaths is required for post-silicon (PS) timing validation, and it is currently becoming timeconsuming due to manufacturing variations. In this paper we...
89
Voted
DAC
2005
ACM
15 years 25 days ago
2005
ACM
A physical yet compact gate delay model is developed integrating short-channel effects and the Alpha-power law based timing model. This analytical approach accurately predicts bot...
93
Voted
DATE
2010
IEEE
15 years 4 months ago
2010
IEEE
—With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits...
DAC
2008
ACM
15 years 12 months ago
2008
ACM
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...