In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
Managing an industrial production facility requires carefully allocating limited resources, and gives rise to large, potentially complicated scheduling problems. In this paper we c...
Eyjolfur Asgeirsson, Jonathan W. Berry, Cynthia A....
We propose an integrity measurement approach based on information flow integrity, which we call the Policy-Reduced Integrity Measurement Architecture (PRIMA). The recent availabi...
Alternative splicing (AS) is an important and frequent step in mammalian gene expression that allows a single gene to specify multiple products, and is crucial for the regulation ...
Ofer Shai, Brendan J. Frey, Quaid Morris, Qun Pan,...
Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed testing of high-speed embedded processors testing in an SoC system. For SBST, test rout...