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APLAS
2006
ACM
15 years 3 months ago
Automatic Testing of Higher Order Functions
This paper tackles a problem often overlooked in functional programming community: that of testing. Fully automatic test tools like Quickcheck and G∀ST can test first order func...
Pieter W. M. Koopman, Rinus Plasmeijer
ICSE
2011
IEEE-ACM
14 years 1 months ago
ReAssert: a tool for repairing broken unit tests
Successful software systems continuously change their requirements and thus code. When this happens, some existing tests get broken because they no longer reflect the intended be...
Brett Daniel, Danny Dig, Tihomir Gvero, Vilas Jaga...
ITC
2003
IEEE
148views Hardware» more  ITC 2003»
15 years 3 months ago
Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs
As the performance of Analog-to-Digital Converters continues to improve, it is becoming more challenging and costly to develop sufficiently fast and low-drift signal generators th...
Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Dega...
DAC
2008
ACM
15 years 10 months ago
Functional test selection based on unsupervised support vector analysis
Extensive software-based simulation continues to be the mainstream methodology for functional verification of designs. To optimize the use of limited simulation resources, coverag...
Onur Guzey, Li-C. Wang, Jeremy R. Levitt, Harry Fo...
VTS
2003
IEEE
115views Hardware» more  VTS 2003»
15 years 3 months ago
Fault Testing for Reversible Circuits
Irreversible computation necessarily results in energy dissipation due to information loss. While small in comparison to the power consumption of today’s VLSI circuits, if curre...
Ketan N. Patel, John P. Hayes, Igor L. Markov