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» Controlling Peak Power During Scan Testing
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ML
2008
ACM
14 years 9 months ago
Layered critical values: a powerful direct-adjustment approach to discovering significant patterns
Standard pattern discovery techniques, such as association rules, suffer an extreme risk of finding very large numbers of spurious patterns for many knowledge discovery tasks. The...
Geoffrey I. Webb
DDECS
2007
IEEE
201views Hardware» more  DDECS 2007»
15 years 3 months ago
Built in Defect Prognosis for Embedded Memories
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskaran...
DATE
1999
IEEE
73views Hardware» more  DATE 1999»
15 years 1 months ago
Channel-Based Behavioral Test Synthesis for Improved Module Reachability
We introduce a novel behavioral test synthesis methodology that attempts to increase module reachability, driven by powerful global design path analysis. Based on the notion of tr...
Yiorgos Makris, Alex Orailoglu
ICDS
2009
IEEE
15 years 4 months ago
An Iterative Method to Design Traffic Flow Models
Existing traffic flow modeling theory lacks of guidelines to construct traffic flow models from scratch. In addition, traffic flow models are mainly analyzed with computer simulat...
Juan Manuel González-Calleros, Jorge Mart&i...
SAFECOMP
1999
Springer
15 years 1 months ago
Formal Design of Distributed Control Systems with Lustre
During the last decade, the synchronous approach has proved to meet industrial needs concerning the development of Distributed Control Systems (DCS): as an example, Schneider Elect...
Paul Caspi, Christine Mazuet, Rym Salem, Daniel We...