74 search results - page 9 / 15 » Controlling Peak Power During Scan Testing |
73
Voted
SAC
2009
ACM
15 years 2 months ago
2009
ACM
The firmware of an electronic voting machine is typically treated as a “trusted” component of the system. Consequently, it is misconstrued to be vulnerable only to an insider...
92
Voted
DFT
1999
IEEE
15 years 1 months ago
1999
IEEE
In the last decade, researchers have devoted increasing efforts to reduce the average power consumption in VLSI systems during normal operation mode, while power consumption durin...
76
Voted
ICCD
2006
IEEE
15 years 6 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
ICCD
2004
IEEE
15 years 6 months ago
2004
IEEE
Many test data compression schemes are based on LFSR reseeding. A drawback of these schemes is that the unspecified bits are filled with random values resulting in a large number ...
DATE
2008
IEEE
15 years 4 months ago
2008
IEEE
Ultra low-power devices are being developed for embedded applications in bio-medical electronics, wireless sensor networks, environment monitoring and protection, etc. The testing...