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» Convolutional Compaction of Test Responses
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ICCAD
1994
IEEE
59views Hardware» more  ICCAD 1994»
15 years 1 months ago
Fault dictionary compaction by output sequence removal
Fault dictionary compaction has been accomplished in the past by removing responses on individual output pins for speci c test vectors. In contrast to the previous work, we presen...
Vamsi Boppana, W. Kent Fuchs
70
Voted
ATS
2002
IEEE
110views Hardware» more  ATS 2002»
15 years 2 months ago
Test Requirement Analysis for Low Cost Hierarchical Test Path Construction
We propose a methodology that examines design modules and identifies appropriate vector justification and response propagation requirements for hierarchical test. Based on a cel...
Yiorgos Makris, Alex Orailoglu
DELTA
2008
IEEE
15 years 4 months ago
AES-Based BIST: Self-Test, Test Pattern Generation and Signature Analysis
Re-using embedded resources for implementing builtin self test mechanisms allows test cost reduction. In this paper we demonstrate how to implement costefficient built-in self tes...
M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre
76
Voted
VTS
1995
IEEE
99views Hardware» more  VTS 1995»
15 years 1 months ago
Arithmetic built-in self test for high-level synthesis
In this paper, we propose an entirely new Built-In Self Test scheme for high-level synthesis of data path architectures that makes use of the arithmetic blocks in the data path to...
Nilanjan Mukherjee, H. Kassab, Janusz Rajski, Jerz...
SIGGRAPH
2010
ACM
15 years 2 months ago
Precomputed wave simulation for real-time sound propagation of dynamic sources in complex scenes
We present a method for real-time sound propagation that captures all wave effects, including diffraction and reverberation, for multiple moving sources and a moving listener in a...
Nikunj Raghuvanshi, John Snyder, Ravish Mehra, Min...