Abstract. Increased power density, hot-spots, and temperature gradients are severe limiting factors for today’s state-of-the-art microprocessors. However, the flexibility offer...
Relentless CMOS scaling coupled with lower design tolerances is making ICs increasingly susceptible to wear-out related permanent faults and transient faults, necessitating on-chi...
Pramod Subramanyan, Virendra Singh, Kewal K. Saluj...
Conventional snoopy-based chip multiprocessors take an aggressive approach broadcasting snoop requests to all nodes. In addition each node checks all received requests. This appro...
— An increasing number of hardware failures can be attributed to device reliability problems that cause partial system failure or shutdown. In this paper we propose a scheme for ...
The drive for low-power, high performance computation coupled with the extremely high design costs for ASIC designs, has driven a number of designers to try to create a flexible, ...
Alex Solomatnikov, Amin Firoozshahian, Wajahat Qad...