3370 search results - page 186 / 674 » Correlation Embedding Analysis |
130
Voted
EMSOFT
2010
Springer
15 years 1 months ago
2010
Springer
In the domain of desktop software, design patterns have had a profound impact; they are applied ubiquitously across a broad range of applications. Patterns serve both to promulgat...
139
Voted
DAC
2002
ACM
16 years 4 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
141
Voted
VLSID
2001
IEEE
16 years 4 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
154
Voted
EMSOFT
2009
Springer
15 years 10 months ago
2009
Springer
System-on-Chip (SoC) is a promising paradigm to implement safety-critical embedded systems, but it poses significant challenges from a design and verification point of view. In ...
116
Voted
EMSOFT
2007
Springer
15 years 9 months ago
2007
Springer
Software components are modular and can enable post-deployment update, but their high overhead in runtime and memory is prohibitive for many embedded systems. This paper proposes ...