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ICCAD
2003
IEEE
195views Hardware» more  ICCAD 2003»
15 years 5 months ago
Vectorless Analysis of Supply Noise Induced Delay Variation
The impact of power supply integrity on a design has become a critical issue, not only for functional verification, but also for performance verification. Traditional analysis has...
Sanjay Pant, David Blaauw, Vladimir Zolotov, Savit...
WISEC
2010
ACM
15 years 6 months ago
pBMDS: a behavior-based malware detection system for cellphone devices
Computing environments on cellphones, especially smartphones, are becoming more open and general-purpose, thus they also become attractive targets of malware. Cellphone malware no...
Liang Xie, Xinwen Zhang, Jean-Pierre Seifert, Senc...
BMCBI
2010
124views more  BMCBI 2010»
14 years 11 months ago
A factor model to analyze heterogeneity in gene expression
Background: Microarray technology allows the simultaneous analysis of thousands of genes within a single experiment. Significance analyses of transcriptomic data ignore the gene d...
Yuna Blum, Guillaume Le Mignon, Sandrine Lagarrigu...
ISBI
2007
IEEE
15 years 6 months ago
Wavelet-Based Statistical Analysis for Optical Imaging in Mouse Olfactory Bulb
Optical imaging is a powerful technique to map brain function in animals. In this study, we consider in vivo optical imaging of the murine olfactory bulb, using an intrinsic signa...
Dimitri Van De Ville, Brice Bathellier, Alan Carle...
DAC
2007
ACM
16 years 19 days ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...