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» Correlation Power Analysis with a Leakage Model
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DATE
2007
IEEE
134views Hardware» more  DATE 2007»
15 years 6 months ago
Accurate temperature-dependent integrated circuit leakage power estimation is easy
— It has been the conventional assumption that, due to the superlinear dependence of leakage power consumption on temperature, and widely varying on-chip temperature profiles, a...
Yongpan Liu, Robert P. Dick, Li Shang, Huazhong Ya...
ICCAD
2009
IEEE
121views Hardware» more  ICCAD 2009»
14 years 9 months ago
MOLES: Malicious off-chip leakage enabled by side-channels
Economic incentives have driven the semiconductor industry to separate design from fabrication in recent years. This trend leads to potential vulnerabilities from untrusted circui...
Lang Lin, Wayne Burleson, Christof Paar
DAC
2004
ACM
15 years 5 months ago
Parametric yield estimation considering leakage variability
Leakage current has become a stringent constraint in today’s processor designs in addition to traditional constraints on frequency. Since leakage current exhibits a strong inver...
Rajeev R. Rao, Anirudh Devgan, David Blaauw, Denni...
INTEGRATION
2007
107views more  INTEGRATION 2007»
14 years 11 months ago
Power and electromagnetic analysis: Improved model, consequences and comparisons
Since their publication in 1998 and 2001 respectively, Power and Electromagnetic Analysis (SPA, DPA, EMA) have been successfully used to retrieve secret information stored in cryp...
Eric Peeters, François-Xavier Standaert, Je...
ISQED
2010
IEEE
151views Hardware» more  ISQED 2010»
15 years 6 months ago
Leakage temperature dependency modeling in system level analysis
Abstract— As the semiconductor technology continues its marching toward the deep sub-micron domain, the strong relation between leakage current and temperature becomes critical i...
Huang Huang, Gang Quan, Jeffrey Fan