Optical lithography is a critical step in the semiconductor manufacturing process, and one key problem is the design of the photomask for a particular circuit pattern, given the o...
Hybrid discrete-continuous models, such as Jump Markov Linear Systems, are convenient tools for representing many real-world systems; in the case of fault detection, discrete jumps...
Lars Blackmore, Askar Bektassov, Masahiro Ono, Bri...
A large number of problems in production planning and scheduling, location, transportation, finance, and engineering design require that decisions be made in the presence of uncer...
This paper presents an efficient implementation of a robust adaptive beamforming algorithm based on convex optimization for applications in the processing-constrained environment...
Eric A. Durant, Ivo Merks, Bill Woods, Jinjun Xiao...
Manufacturing processes are a key source of faults in complex hardware systems. Minimizing this impact of manufacturing uncertainties is one way towards achieving fault tolerant s...