Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
This paper introduces dynamic object colocation, an optimization to reduce copying costs in generational and other incremental garbage collectors by allocating connected objects t...
Background: Many high-throughput genomic experiments, such as Synthetic Genetic Array and yeast two-hybrid, use colony growth on solid media as a screen metric. These experiments ...
John C. Dittmar, Robert J. D. Reid, Rodney Rothste...
Abstract. We present a new parallel computation model called the Parallel ResourceOptimal computation model. PRO is a framework being proposed to enable the design of efficient and...
Fault tolerance mechanisms are a key ingredient of dependable systems. In particular, software-implemented hardware fault tolerance (SIHFT) is gaining in popularity, because of its...