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» Cost and Benefit Models for Logic and Memory BIST
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DATE
2000
IEEE
61views Hardware» more  DATE 2000»
15 years 2 months ago
Cost and Benefit Models for Logic and Memory BIST
Juin-Ming Lu, Cheng-Wen Wu
DATE
2005
IEEE
103views Hardware» more  DATE 2005»
15 years 3 months ago
Noise Figure Evaluation Using Low Cost BIST
A technique for evaluating noise figure suitable for BIST implementation is described. It is based on a low cost single-bit digitizer, which allows the simultaneous evaluation of ...
Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Su...
MTDT
2002
IEEE
108views Hardware» more  MTDT 2002»
15 years 2 months ago
A Fault Modeling Technique to Test Memory BIST Algorithms
The amount of memory being embedded on chip is growing rapidly. This strongly implies that memory Built-in-self-test (BIST) logic assumes utmost importance amongst all on chip sel...
Raja Venkatesh, Sailesh Kumar, Joji Philip, Sunil ...
ITC
2003
IEEE
123views Hardware» more  ITC 2003»
15 years 3 months ago
Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores
1 This paper addresses the issue of testing and diagnosing a memory core embedded in a complex SOC. The proposed solution is based on a P1500-compliant wrapper that follows a progr...
Davide Appello, Paolo Bernardi, Alessandra Fudoli,...
ITC
2003
IEEE
176views Hardware» more  ITC 2003»
15 years 3 months ago
Instruction Based BIST for Board/System Level Test of External Memories and Internconnects
ct This paper describes a general technique to test external memory/caches and memory interconnects using on-chip logic. Such a test methodology is expected to significantly reduc...
Olivier Caty, Ismet Bayraktaroglu, Amitava Majumda...