4 search results - page 1 / 1 » Cost-Effective Concurrent Test Hardware Design for Linear An... |
77
Voted
ICCD
2002
IEEE
15 years 2 months ago
2002
IEEE
Concurrent detection of failures in analog circuits is becoming increasingly more important as safety-critical systems become more widespread. A methodology for the automatic desi...
ITC
2003
IEEE
15 years 2 months ago
2003
IEEE
We present a novel methodology for concurrent error detection in linear analog circuits. We develop a rigorous theory that yields an error detection circuit of size that is, in ge...
ATS
2009
IEEE
15 years 4 months ago
2009
IEEE
—A method of testing for parametric faults of analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit...
VTS
2003
IEEE
15 years 2 months ago
2003
IEEE
We present a novel analog checker that adjusts dynamically the error threshold to the magnitude of its input signals. We demonstrate that this property is crucial for accurate con...