12 search results - page 3 / 3 » Cost-effective radiation hardening technique for combination... |
VLSID
2006
IEEE
14 years 6 months ago
2006
IEEE
With device size shrinking and fast rising frequency ranges, effect of cosmic radiations and alpha particles known as Single-Event-Upset (SEU), Single-Eventtransients (SET), is a ...
DAC
2005
ACM
13 years 8 months ago
2005
ACM
Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technolog...