1944 search results - page 263 / 389 » Coupling-based Integration Testing |
131
Voted
SDM
2009
SIAM
15 years 11 months ago
2009
SIAM
Automotive companies are forced to continuously extend and improve their product line-up. However, increasing diversity, higher design complexity, and shorter development cycles c...
100
Voted
EUROGRAPHICS
2010
Eurographics
15 years 11 months ago
2010
Eurographics
We introduce an approach to visualize stationary 2D vector fields with global uncertainty obtained by considering the transport of local uncertainty in the flow. For this, we ex...
131
Voted
ICCD
2006
IEEE
15 years 11 months ago
2006
IEEE
—Field-Programmable Gate Array (FPGA) technology is characterized by continuous improvements that provide new opportunities in system design. Multiprocessors-ona-Programmable-Chi...
112
Voted
ICCAD
2008
IEEE
15 years 11 months ago
2008
IEEE
— Three-dimensional die stacking integration provides the ability to stack multiple layers of processed silicon with a large number of vertical interconnects. Through Silicon Via...
125
Voted
ICCAD
2006
IEEE
15 years 11 months ago
2006
IEEE
Most existing RCL−1 circuit reductions stamp inverse inductance L−1 elements by a second-order nodal analysis (NA). The NA formulation uses nodal voltage variables and describ...