1944 search results - page 85 / 389 » Coupling-based Integration Testing |
130
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DATE
2009
IEEE
15 years 11 months ago
2009
IEEE
This paper describes a systematic approach that facilitates yield improvement of integrated circuits at the post-manufacture stage. A new Configurable Analogue Transistor (CAT) st...
146
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AINA
2007
IEEE
15 years 11 months ago
2007
IEEE
Malware and rootkits are serious security vulnerabilities, and they can be designed to be resistant to anti-viral software, or even totally undetectable. This paper described a hi...
117
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ADBIS
2007
Springer
15 years 11 months ago
2007
Springer
Replication is crucial to achieve high availability distributed systems. However, non-determinism introduces consistency problems between replicas. Transactions are very well suite...
115
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GLVLSI
2006
IEEE
15 years 11 months ago
2006
IEEE
This paper presents a systematic design methodology for yield enhancement of asynchronous logic circuits using 3-D (3-Dimensional) integration technology. In this design, the targ...
116
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ICDM
2006
IEEE
15 years 10 months ago
2006
IEEE
Efficient and intelligent music information retrieval is a very important topic of the 21st century. With the ultimate goal of building personal music information retrieval syste...