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ICCAD
1996
IEEE
121views Hardware» more  ICCAD 1996»
15 years 1 months ago
Identification of unsettable flip-flops for partial scan and faster ATPG
State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (flip-flops)...
Ismed Hartanto, Vamsi Boppana, W. Kent Fuchs
ISSTA
2004
ACM
15 years 3 months ago
Evolutionary testing of classes
Object oriented programming promotes reuse of classes in multiple contexts. Thus, a class is designed and implemented with several usage scenarios in mind, some of which possibly ...
Paolo Tonella
ISVLSI
2007
IEEE
181views VLSI» more  ISVLSI 2007»
15 years 4 months ago
Code-coverage Based Test Vector Generation for SystemC Designs
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
Alair Dias Jr., Diógenes Cecilio da Silva J...
DFT
2003
IEEE
120views VLSI» more  DFT 2003»
15 years 3 months ago
Implementation and Testing of Fault-Tolerant Photodiode-Based Active Pixel Sensor (APS)
The implementation of imaging arrays for System-On-a-Chip (SOC) is aided by using faulttolerant light sensors. Fault-tolerant redundancy in an Active Pixel Sensor (APS) is obtaine...
Sunjaya Djaja, Glenn H. Chapman, Desmond Y. H. Che...
PRICAI
2000
Springer
15 years 1 months ago
Improved Efficiency of Oil Well Drilling through Case Based Reasoning
A system that applies a method of knowledge-intensive case-based reasoning, for repair and prevention of unwanted events in the domain of offshore oil well drilling, has been deve...
Pål Skalle, Jostein Sveen, Agnar Aamodt