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ITC
2000
IEEE
93views Hardware» more  ITC 2000»
15 years 2 months ago
Stuck-fault tests vs. actual defects
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
Edward J. McCluskey, Chao-Wen Tseng
DAGSTUHL
2004
14 years 11 months ago
Learning with Local Models
Next to prediction accuracy, the interpretability of models is one of the fundamental criteria for machine learning algorithms. While high accuracy learners have intensively been e...
Stefan Rüping
KDD
2009
ACM
227views Data Mining» more  KDD 2009»
15 years 10 months ago
Efficiently learning the accuracy of labeling sources for selective sampling
Many scalable data mining tasks rely on active learning to provide the most useful accurately labeled instances. However, what if there are multiple labeling sources (`oracles...
Pinar Donmez, Jaime G. Carbonell, Jeff Schneider
KDD
2005
ACM
106views Data Mining» more  KDD 2005»
15 years 3 months ago
Enhancing the lift under budget constraints: an application in the mutual fund industry
A lift curve, with the true positive rate on the y-axis and the customer pull (or contact) rate on the x-axis, is often used to depict the model performance in many data mining ap...
Lian Yan, Michael Fassino, Patrick Baldasare
AUSDM
2006
Springer
114views Data Mining» more  AUSDM 2006»
15 years 1 months ago
Consolidated Trees: An Analysis of Structural Convergence
When different subsamples of the same data set are used to induce classification trees, the structure of the built classifiers is very different. The stability of the structure of ...
Jesús M. Pérez, Javier Muguerza, Ola...