2 search results - page 1 / 1 » Critical area computation for missing material defects in VL... |
69
Voted
ISPD
2000
ACM
15 years 2 months ago
2000
ACM
We address the problem of computing critical area for missing material defects in a circuit layout. The extraction of critical area is the main computational problem in VLSI yield...
70
Voted
DAC
2007
ACM
15 years 11 months ago
2007
ACM
In this paper, we propose TROY, the first track router with yield-driven wire planning to optimize yield loss due to random defects. As the probability of failure (POF) computed f...