2 search results - page 1 / 1 » Critical area computation for missing material defects in VL... |
ISPD
2000
ACM
13 years 10 months ago
2000
ACM
We address the problem of computing critical area for missing material defects in a circuit layout. The extraction of critical area is the main computational problem in VLSI yield...
DAC
2007
ACM
14 years 7 months ago
2007
ACM
In this paper, we propose TROY, the first track router with yield-driven wire planning to optimize yield loss due to random defects. As the probability of failure (POF) computed f...