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» Crosstalk analysis in nanometer technologies
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ICCD
2006
IEEE
137views Hardware» more  ICCD 2006»
15 years 6 months ago
Reduction of Crosstalk Pessimism using Tendency Graph Approach
— Accurate estimation of worst-case crosstalk effects is critical for a realistic estimation of the worst-case behavior of deep sub-micron circuits. Crosstalk analysis models usu...
Murthy Palla, Klaus Koch, Jens Bargfrede, Manfred ...
DAC
2006
ACM
15 years 3 months ago
Variation-aware analysis: savior of the nanometer era?
VLSI engineers have traditionally used a variety of CAD analysis tools (e.g. SPICE) to deal with variability. As we go into deep sub micron issues, the analysis is becoming harder...
Sani R. Nassif, Vijay Pitchumani, N. Rodriguez, De...
DAC
2004
ACM
15 years 10 months ago
A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
Chong Zhao, Xiaoliang Bai, Sujit Dey
ICCAD
2007
IEEE
105views Hardware» more  ICCAD 2007»
15 years 6 months ago
High-performance routing at the nanometer scale
— In this work we describe significant improvements to core routing technologies and outperform the best results from the ISPD ‘07 Global Routing Contest, as well as previous ...
Jarrod A. Roy, Igor L. Markov
ISLPED
2009
ACM
127views Hardware» more  ISLPED 2009»
15 years 4 months ago
Nanometer MOSFET effects on the minimum-energy point of 45nm subthreshold logic
In this paper, we observe that minimum energy Emin of subthreshold logic dramatically increases when reaching 45 nm node. We demonstrate by circuit simulation and analytical model...
David Bol, Dina Kamel, Denis Flandre, Jean-Didier ...