Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Te...
Analyzing the effect of crosstalk on delay is critical for high performance circuits. The major bottleneck in performing crosstalkinduced delay analysis is the high computational ...
In deep sub-micron technology, the crosstalk effect between adjacent wires has become an important issue, especially between long on-chip buses. This effect leads to the increas...
In this paper, we propose joint repeater insertion and crosstalk avoidance coding as a low-power alternative to repeater insertion for global bus design in nanometer technologies....