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» Crosstalk analysis in nanometer technologies
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DAC
2006
ACM
15 years 3 months ago
Modeling and minimization of PMOS NBTI effect for robust nanometer design
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
Rakesh Vattikonda, Wenping Wang, Yu Cao
VTS
2008
IEEE
136views Hardware» more  VTS 2008»
15 years 4 months ago
Test-Pattern Grading and Pattern Selection for Small-Delay Defects
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Te...
ICCD
2003
IEEE
134views Hardware» more  ICCD 2003»
15 years 6 months ago
An Efficient Algorithm for Calculating the Worst-case Delay due to Crosstalk
Analyzing the effect of crosstalk on delay is critical for high performance circuits. The major bottleneck in performing crosstalkinduced delay analysis is the high computational ...
Venkatesan Rajappan, Sachin S. Sapatnekar
CODES
2006
IEEE
15 years 3 months ago
A bus architecture for crosstalk elimination in high performance processor design
In deep sub-micron technology, the crosstalk effect between adjacent wires has become an important issue, especially between long on-chip buses. This effect leads to the increas...
Wen-Wen Hsieh, Po-Yuan Chen, TingTing Hwang
ISLPED
2005
ACM
99views Hardware» more  ISLPED 2005»
15 years 3 months ago
A low-power bus design using joint repeater insertion and coding
In this paper, we propose joint repeater insertion and crosstalk avoidance coding as a low-power alternative to repeater insertion for global bus design in nanometer technologies....
Srinivasa R. Sridhara, Naresh R. Shanbhag