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» Current Directions in Automatic Test-Pattern Generation
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ICCAD
1999
IEEE
148views Hardware» more  ICCAD 1999»
13 years 10 months ago
SAT based ATPG using fast justification and propagation in the implication graph
In this paper we present new methods for fast justification and propagation in the implication graph (IG) which is the core data structure of our SAT based implication engine. As ...
Paul Tafertshofer, Andreas Ganz
GRAPHICSINTERFACE
2007
13 years 8 months ago
Improved skeleton extraction and surface generation for sketch-based modeling
For the generation of freeform models, sketching interfaces have raised an increasing interest due to their intuitive approach. It is now possible to infer a 3D model directly fro...
Florian Levet, Xavier Granier
PR
2008
218views more  PR 2008»
13 years 6 months ago
Automatic feature localisation with constrained local models
We present an efficient and robust method of locating a set of feature points in an object of interest. From a training set we construct a joint model of the appearance of each fe...
David Cristinacce, Timothy F. Cootes
VLSID
2007
IEEE
154views VLSI» more  VLSID 2007»
14 years 6 months ago
Model Based Test Generation for Microprocessor Architecture Validation
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...
Sreekumar V. Kodakara, Deepak Mathaikutty, Ajit Di...
VLDB
1999
ACM
147views Database» more  VLDB 1999»
13 years 10 months ago
Data-Driven, One-To-One Web Site Generation for Data-Intensive Applications
A data-driven approach can be fruitfully used in the speci cation and automatic generation of data-intensive Web applications, i.e., applications which make large amounts of data ...
Stefano Ceri, Piero Fraternali, Stefano Paraboschi