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CP
2009
Springer
15 years 10 months ago
2009
Springer
The goal of testing is to distinguish between a number of hypotheses about a systemfor example, dierent diagnoses of faults by applying input patterns and verifying or falsifying t...
ICCD
2004
IEEE
15 years 6 months ago
2004
IEEE
Leakage current is a key factor in IC power consumption even in the active operating mode. We investigate the simultaneous optimization of gate size and threshold voltage to reduc...
ICCD
2004
IEEE
15 years 6 months ago
2004
IEEE
Three dimensional vertically integrated systems allow active devices to be placed on multiple device layers. In recent years, a number of research efforts have addressed physical ...
ICCAD
2007
IEEE
15 years 6 months ago
2007
IEEE
Increasing effects of fabrication variability have inspired a growing interest in statistical techniques for design optimization. In this work, we propose a Monte-Carlo driven sto...
ICCAD
2002
IEEE
15 years 6 months ago
2002
IEEE
Application-specific instructions can significantly improve the performance, energy, and code size of configurable processors. A common approach used in the design of such instruc...