39 search results - page 4 / 8 » DELTEST: Deterministic Test Generation for Gate-Delay Faults |
ENTCS
2007
14 years 9 months ago
2007
Modern software is increasingly concurrent, timed, distributed, and therefore, non-deterministic. While it is well known that tests can be generated as LTL or CTL model checker co...
ETS
2009
IEEE
14 years 7 months ago
2009
IEEE
Structural on-line self-test may be performed to detect permanent faults and avoid their accumulation. This paper improves concurrent BIST techniques based on a deterministic test ...
SAC
2008
ACM
14 years 9 months ago
2008
ACM
Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed testing of high-speed embedded processors testing in an SoC system. For SBST, test rout...
DATE
1997
IEEE
15 years 1 months ago
1997
IEEE
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...
ICCAD
1997
IEEE
15 years 1 months ago
1997
IEEE
We consider the problem of built-in test generation for synchronous sequential circuits. The proposed scheme leaves the circuit flip-flops unmodified, and thus allows at-speed ...