27 search results - page 6 / 6 » DRAM reliability |
158
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SAS
2007
Springer
15 years 11 months ago
2007
Springer
Abstract. Silicon chip design has passed a threshold whereby exponentially increasing transistor density (Moore’s Law) no longer translates into increased processing power for si...
210
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DSN
2011
IEEE
14 years 4 months ago
2011
IEEE
Phase change memory (PCM) has emerged as a promising technology for main memory due to many advan tages, such as better scalability, non-volatility and fast read access. However,...