This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
As the amount of available data continues to increase, more and more effective means for discovering important patterns and relationships within that data are required. Although t...
Common problem encountered in the analysis of dynamic scene is the problem of simultaneous estimation of the number of models and their parameters. This problem becomes difficult a...
In this paper, we give a simple scheme for identifying approximate frequent items over a sliding window of size n. Our scheme is deterministic and does not make any assumption on ...
Abstract—This paper presents a capture of the queries managed by an eDonkey server during almost 10 weeks, leading to the observation of almost 9 billion messages involving almos...