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ITC
1998
IEEE
174views Hardware» more  ITC 1998»
15 years 11 months ago
High volume microprocessor test escapes, an analysis of defects our tests are missing
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong
WEBI
2004
Springer
16 years 7 days ago
An Integrated Approach to Discovery in Complex Information Spaces
As the amount of available data continues to increase, more and more effective means for discovering important patterns and relationships within that data are required. Although t...
Daryl H. Hepting, Cory J. Butz
ECCV
2006
Springer
15 years 10 months ago
Nonparametric Estimation of Multiple Structures with Outliers
Common problem encountered in the analysis of dynamic scene is the problem of simultaneous estimation of the number of models and their parameters. This problem becomes difficult a...
Wei Zhang, Jana Kosecká
PODS
2006
ACM
217views Database» more  PODS 2006»
16 years 7 months ago
A simpler and more efficient deterministic scheme for finding frequent items over sliding windows
In this paper, we give a simple scheme for identifying approximate frequent items over a sliding window of size n. Our scheme is deterministic and does not make any assumption on ...
Lap-Kei Lee, H. F. Ting
IPPS
2009
IEEE
16 years 1 months ago
Ten weeks in the life of an eDonkey server
Abstract—This paper presents a capture of the queries managed by an eDonkey server during almost 10 weeks, leading to the observation of almost 9 billion messages involving almos...
Frederic Aidouni, Matthieu Latapy, Clémence...