635 search results - page 91 / 127 » Data Criticality in Network-On-Chip Design |
92
Voted
ASPDAC
2009
ACM
15 years 7 months ago
2009
ACM
Abstract— Double patterning lithography (DPL) is in current production for memory products, and is widely viewed as inevitable for logic products at the 32nm node. DPL decomposes...
89
Voted
DATE
2008
IEEE
15 years 7 months ago
2008
IEEE
Stream processing applications such as image signal processing demand high throughput. However, customers increasingly demand runtime flexibility in their designs, which cannot b...
121
Voted
NDSS
2008
IEEE
15 years 6 months ago
2008
IEEE
Accurate network measurement through trace collection is critical for advancing network design and for maintaining secure, reliable networks. Unfortunately, the release of network...
112
Voted
EUROPKI
2007
Springer
15 years 6 months ago
2007
Springer
The central goal of Public Key Infrastructure (PKI) is to enable trust judgments between distributed users. Although certificates play a central role in making such judgments, a P...
96
Voted
ISSAC
2007
Springer
15 years 6 months ago
2007
Springer
An algorithm is presented for the geometric analysis of an algebraic curve f(x, y) = 0 in the real affine plane. It computes a cylindrical algebraic decomposition (CAD) of the pla...