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84
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ICCAD
2010
IEEE
133views Hardware» more  ICCAD 2010»
14 years 7 months ago
Testing methods for detecting stuck-open power switches in coarse-grain MTCMOS designs
Coarse-grain multi-threshold CMOS (MTCMOS) is an effective power-gating technique to reduce IC's leakage power consumption by turning off idle devices with MTCMOS power switc...
Szu-Pang Mu, Yi-Ming Wang, Hao-Yu Yang, Mango Chia...
DAC
2007
ACM
15 years 10 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
95
Voted
DATE
2005
IEEE
154views Hardware» more  DATE 2005»
15 years 3 months ago
Secure Embedded Processing through Hardware-Assisted Run-Time Monitoring
— Security is emerging as an important concern in embedded system design. The security of embedded systems is often compromised due to vulnerabilities in “trusted” software t...
Divya Arora, Srivaths Ravi, Anand Raghunathan, Nir...
ICDM
2005
IEEE
139views Data Mining» more  ICDM 2005»
15 years 3 months ago
Approximate Inverse Frequent Itemset Mining: Privacy, Complexity, and Approximation
In order to generate synthetic basket data sets for better benchmark testing, it is important to integrate characteristics from real-life databases into the synthetic basket data ...
Yongge Wang, Xintao Wu
87
Voted
ISLPED
2003
ACM
152views Hardware» more  ISLPED 2003»
15 years 2 months ago
An MTCMOS design methodology and its application to mobile computing
The Multi-Threshold CMOS (MTCMOS) technology provides a solution to the high performance and low power design requirements of modern designs. While the low Vth transistors are use...
Hyo-Sig Won, Kyo-Sun Kim, Kwang-Ok Jeong, Ki-Tae P...