19342 search results - page 138 / 3869 » Decentralised Process Modelling |
172
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BMCBI
2008
15 years 5 months ago
2008
Background: Predictive classification on the base of gene expression profiles appeared recently as an attractive strategy for identifying the biological functions of genes. Gene O...
243
Voted
Publication
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
131
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ICST
2009
IEEE
15 years 11 months ago
2009
IEEE
Automated static analysis can identify potential source code anomalies early in the software process that could lead to field failures. However, only a small portion of static ana...
133
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IJCAI
2003
15 years 6 months ago
2003
Multi-level spatial aggregates are important for data mining in a variety of scientific and engineering applications, from analysis of weather data (aggregating temperature and p...
CORR
2010
Springer
15 years 5 months ago
2010
Springer
This paper investigates the effect of process variations on unity gain frequency (ft) in 30 nm gate length FinFET by performing extensive TCAD simulations. Six different geometric...