Sciweavers

568 search results - page 64 / 114
» Decoupled Hardware Support for Distributed Shared Memory
Sort
View
WISES
2003
15 years 1 months ago
Function Test Framework for Testing IO-Blocks in a Model-Based Rapid Prototyping Development Environment for Embedded Control Ap
— Testing and verification are important methods for gaining confidence in the reliability of a software product. Keeping this confidence up is especially difficult for softw...
Stefan Pitzek, Peter P. Puschner
DATE
2005
IEEE
160views Hardware» more  DATE 2005»
15 years 5 months ago
SOC Testing Methodology and Practice
Abstract—On a commercial digital still camera (DSC) controller chip we practice a novel SOC test integration platform, solving real problems in test scheduling, test IO reduction...
Cheng-Wen Wu
IEEEPACT
2006
IEEE
15 years 5 months ago
Testing implementations of transactional memory
Transactional memory is an attractive design concept for scalable multiprocessors because it offers efficient lock-free synchronization and greatly simplifies parallel software....
Chaiyasit Manovit, Sudheendra Hangal, Hassan Chafi...
ISCA
2010
IEEE
239views Hardware» more  ISCA 2010»
15 years 4 months ago
Sentry: light-weight auxiliary memory access control
Light-weight, flexible access control, which allows software to regulate reads and writes to any granularity of memory region, can help improve the reliability of today’s multi...
Arrvindh Shriraman, Sandhya Dwarkadas
DDECS
2007
IEEE
201views Hardware» more  DDECS 2007»
15 years 6 months ago
Built in Defect Prognosis for Embedded Memories
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskaran...