34 search results - page 3 / 7 » Deductive Fault Simulation for Asynchronous Sequential Circu... |
ATS
2001
IEEE
15 years 1 months ago
2001
IEEE
ICCAD
1997
IEEE
15 years 1 months ago
1997
IEEE
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
ATS
1998
IEEE
15 years 1 months ago
1998
IEEE
We propose a new static test set compaction method based on a careful examination of attributes of fault coverage curves. Our method is based on two key ideas: 1 fault-list and te...
VTS
2003
IEEE
15 years 2 months ago
2003
IEEE
: This paper presents a novel, low cost technique based on implications to identify untestable bridging faults in sequential circuits. Sequential symbolic simulation [1] is first p...