34 search results - page 3 / 7 » Deductive Fault Simulation for Asynchronous Sequential Circu... |
DAC
1992
ACM
13 years 10 months ago
1992
ACM
ATS
2001
IEEE
13 years 10 months ago
2001
IEEE
ICCAD
1997
IEEE
13 years 10 months ago
1997
IEEE
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
ATS
1998
IEEE
13 years 10 months ago
1998
IEEE
We propose a new static test set compaction method based on a careful examination of attributes of fault coverage curves. Our method is based on two key ideas: 1 fault-list and te...
VTS
2003
IEEE
13 years 11 months ago
2003
IEEE
: This paper presents a novel, low cost technique based on implications to identify untestable bridging faults in sequential circuits. Sequential symbolic simulation [1] is first p...