41 search results - page 7 / 9 » Defect Tolerance in Multiple-FPGA Systems |
107
Voted
MIDDLEWARE
2009
Springer
15 years 7 months ago
2009
Springer
Abstract. Enterprise-system upgrades are unreliable and often produce downtime or data-loss. Errors in the upgrade procedure, such as broken dependencies, constitute the leading ca...
101
Voted
DAC
2005
ACM
16 years 2 months ago
2005
ACM
Device and interconnect fabrics at the nanoscale will have a density of defects and susceptibility to transient faults far exceeding those of current silicon technologies. In this...
94
Voted
PRDC
2008
IEEE
15 years 7 months ago
2008
IEEE
Reliability has become a serious concern as systems embrace nanometer technologies. In this paper, we propose a novel approach for organizing redundancy that provides high degree ...
133
Voted
TASE
2008
IEEE
15 years 1 months ago
2008
IEEE
Applications such as layered manufacturing, or in general, solid free-form fabrication, pose a major challenge on online process control. For these parts to be functional, it is i...
122
Voted
STORAGESS
2006
ACM
15 years 7 months ago
2006
ACM
Batch-correlated failures result from the manifestation of a common defect in most, if not all, disk drives belonging to the same production batch. They are much less frequent tha...