Nanometer circuits are highly susceptible to soft errors generated by alpha-particle or atmospheric neutron strikes to circuit nodes. The reasons for the high susceptibility are t...
We present experimental analysis to exploit the sequence dependence on energy saving in error tolerant image processing. Our analysis shows that the error distributions depend not...
As device sizes shrink, FPGAs are increasingly prone to manufacturing defects. The ability to tolerate multiple defects is anticipated to be very important at 45nm and beyond. One...
- Triple Modular Redundancy is widely used in dependable systems design to ensure high reliability against soft errors. Conventional TMR is effective in protecting sequential circu...
Wei Chen, Rui Gong, Fang Liu, Kui Dai, Zhiying Wan...
This paper considers the robust stability of neural networks with multiple delays. Based on Lyapunov stability theory and linear matrix inequality technique, some new delay indepe...