138 search results - page 23 / 28 » Delay modeling and static timing analysis for MTCMOS circuit... |
DATE
2010
IEEE
15 years 4 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
ASPDAC
2005
ACM
15 years 1 months ago
2005
ACM
- This paper presents a novel approach for fast transient analysis of buffered hybrid structured clock networks. The new method applies structure reduction and relaxed hierarchical...
TASLP
2010
14 years 10 months ago
2010
—The digital emulation of analog audio effects and synthesis components, through the simulation of lumped circuit components has seen a large amount of activity in recent years; ...
SIGCOMM
2009
ACM
15 years 6 months ago
2009
ACM
The analysis of social and technological networks has attracted a lot of attention as social networking applications and mobile sensing devices have given us a wealth of real data...
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DAC
2006
ACM
15 years 5 months ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...