— Variability in the chip design process has been relatively increasing with technology scaling to smaller dimensions. Using worst case analysis for circuit optimization severely...
Abstract— Over the last decade, the design of ultra-lowpower digital circuits in subthreshold regime has been driven by the quest for minimum energy per operation. In this contri...
David Bol, Renaud Ambroise, Denis Flandre, Jean-Di...
This paper presents a two-step, RC-interconnect insensitive linear time-varying (LTV) driver model for gate-level timing calculation. We show how to characterize a driver with the...
We propose a scalable and efficient parameterized block-based statistical static timing analysis algorithm incorporating both Gaussian and non-Gaussian parameter distributions, ca...
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...