1125 search results - page 149 / 225 » Dependability in Aggregation by Averaging |
ASAP
2007
IEEE
15 years 4 months ago
2007
IEEE
With increasing reliability concerns for current and next generation VLSI technologies, fault-tolerance is fast becoming an integral part of system-on-chip and multicore architect...
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CODES
2007
IEEE
15 years 4 months ago
2007
IEEE
Instruction Set Simulation (ISS) is widely used in system evaluation and software development for embedded processors. Despite the significant advancements in the ISS technology,...
DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
Global interconnect temperature keeps rising in the current and future technologies due to self-heating and the adiabatic property of top metal layers. The thermal e ects impact a...
DSN
2007
IEEE
15 years 4 months ago
2007
IEEE
While the new generation of hand-held devices, e.g., smart phones, support a rich set of applications, growing complexity of the hardware and runtime environment makes the devices...
GLOBECOM
2007
IEEE
15 years 4 months ago
2007
IEEE
— Energy-ef ciency is one of the major concerns in wireless sensor networks since it impacts the network lifetime. In this paper, we investigate the relationship between sensor n...