1125 search results - page 57 / 225 » Dependability in Aggregation by Averaging |
DATE
2008
IEEE
15 years 4 months ago
2008
IEEE
The fraction of ICs that pass all production tests but fail in the application is called the defect level. Defect levels depend on the average number of defects per IC, and also o...
CORR
2004
Springer
14 years 10 months ago
2004
Springer
We prove general exponential moment inequalities for averages of [0,1]valued iid random variables and use them to tighten the PAC Bayesian Theorem. The logarithmic dependence on t...
ICCD
2007
IEEE
15 years 4 months ago
2007
IEEE
Leakage power has grown significantly and is a major challenge in microprocessor design. Leakage is the dominant power component in second-level (L2) caches. This paper presents t...
INFOCOM
2007
IEEE
15 years 4 months ago
2007
IEEE
— We consider an uplink power control problem where each mobile wishes to maximize its throughput (which depends on the transmission powers of all mobiles) but has a constraint o...
76
Voted
GC
2004
Springer
15 years 3 months ago
2004
Springer
Abstract. Is it possible to treat large scale distributed systems as physical systems? The importance of that question stems from the fact that the behavior of many P2P systems is ...