497 search results - page 87 / 100 » Design Challenges for High Performance Nano-Technology |
DAC
2007
ACM
15 years 10 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
INFOCOM
2007
IEEE
15 years 3 months ago
2007
IEEE
Next-generation high-end Network Processors (NP) must address demands from both diversified applications and ever-increasing traffic pressure. One major challenge is to design an e...
ISCA
2006
IEEE
15 years 3 months ago
2006
IEEE
The physical layer of most wireless protocols is traditionally implemented in custom hardware to satisfy the heavy computational requirements while keeping power consumption to a ...
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ICAC
2009
IEEE
15 years 4 months ago
2009
IEEE
Automatic management of large-scale production systems requires a continuous monitoring service to keep track of the states of the managed system. However, it is challenging to ac...
DATE
2008
IEEE
15 years 3 months ago
2008
IEEE
— As the feature size of transistors gets smaller, fabricating them becomes challenging. Manufacturing process follows various corrective design-for-manufacturing (DFM) steps to ...