473 search results - page 18 / 95 » Design Methodologies for Noise in Digital Integrated Circuit... |
ISQED
2007
IEEE
15 years 6 months ago
2007
IEEE
Errors caused by tolerance variations and mismatches among components severely degrade the performance of integrated circuits. These random effects in process parameters significa...
DAC
1999
ACM
15 years 4 months ago
1999
ACM
We present a methodology for the watermarking of synchronous sequential circuits that makes it possible to identify the authorship of designs by imposing a digital watermark on th...
122
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ISQED
2006
IEEE
15 years 5 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
TVLSI
2008
14 years 11 months ago
2008
Thermal management is critical for integrated circuit (IC) design. With each new IC technology generation, feature sizes decrease, while operating speeds and package densities incr...
103
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DSD
2010
IEEE
14 years 12 months ago
2010
IEEE
Abstract—Continuously shrinking feature sizes cause an increasing vulnerability of digital circuits. Manufacturing failures and transient faults may tamper the functionality. Aut...