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DAC
2004
ACM
15 years 10 months ago
A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
Chong Zhao, Xiaoliang Bai, Sujit Dey
ICCAD
1994
IEEE
115views Hardware» more  ICCAD 1994»
15 years 1 months ago
Fast transient power and noise estimation for VLSI circuits
Abstract - Today's digital design systems are running out of steam, when it comes to meeting the challenges presented by simultaneous switching, power consumption and reliabil...
Wolfgang T. Eisenmann, Helmut E. Graeb
ISCAS
2007
IEEE
106views Hardware» more  ISCAS 2007»
15 years 3 months ago
Ensemble Dependent Matrix Methodology for Probabilistic-Based Fault-tolerant Nanoscale Circuit Design
—Two probabilistic-based models, namely the Ensemble-Dependent Matrix model [1][3] and the Markov Random Field model [2], have been proposed to deal with faults in nanoscale syst...
Huifei Rao, Jie Chen, Changhong Yu, Woon Tiong Ang...
ASAP
1997
IEEE
156views Hardware» more  ASAP 1997»
15 years 1 months ago
Design methodology for digital signal processing
Improvements in semiconductor integration density and the resulting problem of having to manage designs of increasing complexity is an old one, but still current. The new challeng...
Gerhard Fettweis
ASPDAC
2007
ACM
96views Hardware» more  ASPDAC 2007»
15 years 1 months ago
Hierarchical Optimization Methodology for Wideband Low Noise Amplifiers
In this paper, we present a systematic synthesis methodology for fully integrated wideband low noise amplifiers that simultaneously optimizes impedance matching, noise figure, and ...
Arthur Nieuwoudt, Tamer Ragheb, Yehia Massoud