473 search results - page 35 / 95 » Design Methodologies for Noise in Digital Integrated Circuit... |
EVOW
2000
Springer
15 years 3 months ago
2000
Springer
Modern VLSI design methodologies and manufacturing technologies are making circuits increasingly fast. The quest for higher circuit performance and integration density stems from f...
VLSID
2008
IEEE
16 years 6 days ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
DAC
2009
ACM
16 years 25 days ago
2009
ACM
Efficient system-level design is increasingly relying on hierarchical design-space exploration, as well as compositional methods, to shorten time-to-market, leverage design re-use...
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DAC
2003
ACM
15 years 5 months ago
2003
ACM
In recent years, due to rapid advances in VLSI manufacturing technology capable of packing more and more devices and wires on a chip, crosstalk has emerged as a serious problem af...
DATE
2003
IEEE
15 years 5 months ago
2003
IEEE
The specification on power consumption of a digital system is extremely important due to the growing relevance of the market of portable devices and must be taken into account sin...