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ICCAD
2009
IEEE
121views Hardware» more  ICCAD 2009»
14 years 9 months ago
MOLES: Malicious off-chip leakage enabled by side-channels
Economic incentives have driven the semiconductor industry to separate design from fabrication in recent years. This trend leads to potential vulnerabilities from untrusted circui...
Lang Lin, Wayne Burleson, Christof Paar
DAC
2004
ACM
16 years 24 days ago
Reliability-driven layout decompaction for electromigration failure avoidance in complex mixed-signal IC designs
The negative effect of electromigration on signal and power line lifetime and functional reliability is an increasingly important problem for the physical design of integrated cir...
Goeran Jerke, Jürgen Scheible, Jens Lienig
ISCAS
2003
IEEE
134views Hardware» more  ISCAS 2003»
15 years 5 months ago
Analog and mixed signal modelling with SystemC-AMS
SystemC will become more and more important for the design of digital circuits from the specification down to the RT-Level. Complex systems often contain analog components. This p...
Alain Vachoux, Christoph Grimm, Karsten Einwich
DAC
2008
ACM
15 years 1 months ago
Analog parallelism in ring-based VCOs
The performance advantages in parallel ring-based VCOs are explored. When the number of VCOs is doubled, the parallel VCOs enhance phase noise by 3dB, and the within-chip process-...
Daeik D. Kim, Choongyeun Cho, Jonghae Kim
ISCAS
2007
IEEE
179views Hardware» more  ISCAS 2007»
15 years 6 months ago
Analysis for Signal and Power Integrity Using the Multilayered Finite Difference Method
— We present a method for fast analysis of signal and power integrity based on a recently developed multilayered finite difference method (M-FDM). In order to accurately model m...
Ege Engin, Krishna Bharath, Madhavan Swaminathan