8729 search results - page 1596 / 1746 » Design Of Experiments: Overview |
230
Voted
ICCD
2008
IEEE
16 years 3 months ago
2008
IEEE
— Clock frequency and transistor density increases have resulted in elevated chip temperatures. In order to meet temperature constraints while still exploiting the performance op...
155
click to vote
ICCAD
2008
IEEE
16 years 3 months ago
2008
IEEE
Abstract— As VLSI technology enters the nanoscale regime, interconnect delay becomes the bottleneck of circuit performance. Compared to gate delays, wires are becoming increasing...
141
click to vote
ICCAD
2004
IEEE
16 years 3 months ago
2004
IEEE
Abstract— High-level synthesis (HLS) of memory-intensive applications has featured several innovations in terms of enhancements made to the basic memory organization and data lay...
192
click to vote
ICCAD
2003
IEEE
16 years 3 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
170
click to vote
ICCAD
2002
IEEE
16 years 3 months ago
2002
IEEE
We propose to introduce redundant interconnects for manufacturing yield and reliability improvement. By introducing redundant interconnects, the potential for open faults is reduc...