6624 search results - page 342 / 1325 » Design Pattern Recognition |
140
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ITCC
2005
IEEE
15 years 9 months ago
2005
IEEE
Developing large multi-agent systems is a complex task involving the processes of the requirement, architecture, design and implementation of these systems. In particular, the arc...
129
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DAC
2009
ACM
16 years 4 months ago
2009
ACM
In double patterning lithography (DPL), coloring conflict and stitch minimization are the two main challenges. Post layout decomposition algorithm [1] [2]may not be enough to achi...
102
Voted
DATE
2003
IEEE
15 years 8 months ago
2003
IEEE
Abstract : A novel design methodology for test pattern generation in BIST is presented. Here faults and errors in the generator itself are detected. Two different design methodolog...
124
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ECOOP
2008
Springer
15 years 5 months ago
2008
Springer
The adapter design pattern [1], commonly used for integration and evolution in component-based systems, is originally described by roles. In classbased systems, the conventional re...
151
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ISPD
2007
ACM
15 years 5 months ago
2007
ACM
When VLSI technology scales toward 45nm, the lithography wavelength stays at 193nm. This large gap results in strong refractive effects in lithography. Consequently, it is a huge...