6624 search results - page 478 / 1325 » Design Pattern Recognition |
126
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ICSE
2003
IEEE-ACM
16 years 4 months ago
2003
IEEE-ACM
ion. riented language features, such as abstract classes, inheritance, dynamic binding, and parameterized types. Middleware, such as object-oriented frameworks for host infrastruct...
150
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VTS
2008
IEEE
15 years 11 months ago
2008
IEEE
— Higher chip densities and the push for higher performance have continued to drive design needs. Transition delay fault testing has become the preferred method for ensuring thes...
144
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IWCMC
2006
ACM
15 years 10 months ago
2006
ACM
Wireless sensors use low power radio transceivers due to the stringent constraints on battery capacity. As a result, radio transmission with wireless sensors is unreliable. Furthe...
136
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VTS
1995
IEEE
15 years 8 months ago
1995
IEEE
This paper presents a new approach for on-chip test pattern generation. The set of test patterns generated by a pseudo-random pattern generator (e.g., an LFSR) is transformed into...
137
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WICSA
2004
15 years 6 months ago
2004
In this paper, we present an approach to improve the software architecture evaluation process by systematically extracting and appropriately documenting architecturally significan...