6624 search results - page 482 / 1325 » Design Pattern Recognition |
122
Voted
ICDM
2003
IEEE
15 years 10 months ago
2003
IEEE
Analyzing data to find trends, correlations, and stable patterns is an important problem for many industrial applications. In this paper, we propose a new technique based on paral...
151
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SIGGRAPH
2010
ACM
15 years 9 months ago
2010
ACM
Geodesic curves in surfaces are not only minimizers of distance, but they are also the curves of zero geodesic (sideways) curvature. It turns out that this property makes patterns...
116
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ITC
2000
IEEE
15 years 9 months ago
2000
IEEE
A common approachfor large industrial designs is to use logic built-in self-test (LBIST)followed by test data from an external tester. Because the fault coverage with LBIST alone ...
154
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FPL
2007
Springer
15 years 8 months ago
2007
Springer
Extensible processors allow addition of application-specific custom instructions to the core instruction set architecture. These custom instructions are selected through an analys...
134
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DATE
2008
IEEE
15 years 11 months ago
2008
IEEE
— Market and customer demands have continued to push the limits of CMOS performance. At-speed test has become a common method to ensure these high performance chips are being shi...